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Advancements in Optical ­Methods, Digital Image ­Correlation & Micro-and ­Nanomechanics, Volume 4
Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics (Conference Proceedings of the Society for Experimental Mechanics Series)
By Ming-Tzer Lin (Edited by), Cosme Furlong (Edited by), Chi-Hung Hwang (Edited by), Mohammad Naraghi (Edited by)

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Format
Paperback, 81 pages
Published
12 February 2024

Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4 of the Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering.  The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:

 

DIC Methods & Its Applications

Photoelsticity and Interferometry Applications

Micro-Optics and Microscopic Systems

Multiscale and New Developments in Optical Methods

Extreme Nanomechanics

In-Situ Nanomechanics

Expanding Boundaries in Metrology

Micro and Nanoscale Deformation

MEMS for Actuation, Sensing and Characterization

1D & 2D Materials

Show more

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Product Description

Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4 of the Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering.  The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:

 

DIC Methods & Its Applications

Photoelsticity and Interferometry Applications

Micro-Optics and Microscopic Systems

Multiscale and New Developments in Optical Methods

Extreme Nanomechanics

In-Situ Nanomechanics

Expanding Boundaries in Metrology

Micro and Nanoscale Deformation

MEMS for Actuation, Sensing and Characterization

1D & 2D Materials

Show more
Product Details
EAN
9783031174735
ISBN
3031174739
Dimensions
27.9 x 21 x 0.5 centimeters (0.25 kg)
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